• DocumentCode
    1210028
  • Title

    Investigation of a Mechanism Forming Irregular Loops in Large CIC Conductor

  • Author

    Yagai, T. ; Nara, Y. ; Ohmura, J. ; Tsuda, M. ; Hamajima, T. ; Nunoya, Y. ; Okuno, K. ; Takahata, K.

  • Author_Institution
    Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai
  • Volume
    18
  • Issue
    2
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    1123
  • Lastpage
    1126
  • Abstract
    Coupling loss with long time constants has been found a troublesome phenomenon for large size magnet application of superconductor because it would not be simply estimated from AC loss measurement of short sample conductor. In order to investigate the mechanism of the loss, we measured trajectories of strands of sample CIC (34 = 81) conductor. The measured length is 1 m along the conductor axis. By analyzing those trajectories, two important facts are cleared. One is that contact periods between two strands are calculated by the function of twisting pitches, not always by the Least Common Multiplier of twisting pitches. The other is that contact probabilities of two strands at each contactable point of sub cables depend on the difference of rotation angles of sub cables. To confirm the validity of this method, we calculated lengths of coupling current loops within 1 m in length by using experimentally obtained contact probabilities. The results are in very good agreement with lengths obtained from experimental results of strand trajectories. Then we computed the loop length in the long conductor (<100 m), it was obtained that the average loop length would reached about 3 m.
  • Keywords
    loss measurement; superconducting cables; superconducting magnets; AC loss measurement; cable-in-conduit; coupling current loop; coupling loss; large CIC conductor; strand probability; superconductor magnet application; CIC conductor; contact probability; contactable period; coupling current loop;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2008.920825
  • Filename
    4510856