DocumentCode :
1210042
Title :
N.I.P. Silicon Junctions Detectors
Author :
Koch, Lydie ; Messier, Jean ; Valin, Jean
Author_Institution :
Centre d´´Etudes Nucléaires de Saclay - France
Volume :
8
Issue :
1
fYear :
1961
Firstpage :
43
Lastpage :
49
Abstract :
N.I.P. Silicon junctions have been studied as particle detectors. They consist of a 1.000 ¿.cm silicon plate on each side of which respectively a P and N layer have been diffused in order to have a NIP structure. The incident particles 9 to 40 MeV alpha, are parallel with the junctions planes, and strike the detector in the I region. An energy resolution of 2 % and a good linearity of pulse height vs particle energy up to 40 MeV have been obtained. In addition, gamma rays have been detected with NIP junctions, and pulse height distribution of Co60, Ca137 and Hg203 have been stutied. The average amount of energy expended by a photoelectric electron in creating one electron-hole pair in silicon has been measured and is found to be : E = 3,53±0,07 eV for 279 keV electrons E = 3,55±0,1 eV for 660 keV electrons.
Keywords :
Electrons; Energy measurement; Energy resolution; Gamma ray detection; Gamma ray detectors; Gamma rays; Linearity; Radiation detectors; Semiconductor counters; Silicon;
fLanguage :
English
Journal_Title :
Nuclear Science, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2015
Type :
jour
DOI :
10.1109/TNS2.1961.4315797
Filename :
4315797
Link To Document :
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