• DocumentCode
    1210392
  • Title

    Effect of plasma treatment of Au-Ni-Cu bond pads on process windows of Au wire bonding

  • Author

    Chan, Yu Hin ; Kim, Jang-Kyo ; Deming Liu ; Liu, Deming ; Cheung, Yiu-Ming ; Ng, Ming Wai

  • Author_Institution
    Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • Volume
    28
  • Issue
    4
  • fYear
    2005
  • Firstpage
    674
  • Lastpage
    684
  • Abstract
    The wire bondability of Au-Ni-Cu bond pads with different Au plating schemes, including electrolytic and immersion plates, are evaluated after plasma treatment. The plasma cleaning conditions, such as cleaning power and time, are optimized based on the process window and wire pull strength measurements for different bond pad temperatures. Difference in the efficiency of plasma treatment in improving the wire bondability for different Au plates is identified. The plasma-cleaned bond pads are exposed to air to evaluate the recontamination process and the corresponding degradation of wire pull strength. The changes in bond pad surface characteristics, such as surface free energy and polar functionality, with exposure time are correlated to the wire pull strength, which in turn provides practical information about the shelf life of wire bonding after plasma cleaning.
  • Keywords
    bonding processes; copper alloys; gold alloys; nickel alloys; plasma materials processing; surface cleaning; surface energy; Au-Ni-Cu; bond pads; bondability; plasma cleaning; plasma treatment effect; process windows; wire bonding; Bonding; Cleaning; Gold; Plasma measurements; Plasma properties; Plasma temperature; Power measurement; Surface treatment; Time measurement; Wire; Au wire bond; Au–Ni–Cu bond pad; plasma treatment; process window; surface energy;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2005.853548
  • Filename
    1528652