• DocumentCode
    1210409
  • Title

    Wire-bonding process monitoring using thermopile temperature sensor

  • Author

    Suman, Shivesh ; Gaitan, Michael ; Joshi, Yogendra ; Harman, George G.

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    28
  • Issue
    4
  • fYear
    2005
  • Firstpage
    685
  • Lastpage
    693
  • Abstract
    This work presents an approach to separate the thermal response due to ultrasonic excitation and ball deformation through novel application of aluminum-polysilicon thermopile sensors under the bond pad. These integrated thermopile sensors measure temperature at a radial distance under the bond pad, in contrast to the previously reported average measurements over the bond pad interface or around the bond pad over a radial distance. The high sensitivity and signal-to-noise ratio (SNR) of the sensor allow direct measurements of the signal, without any amplification or filtration. Transient temperature variations at two radial locations were obtained using two versions of thermopile sensor designs. The sensor response was interpreted using representative finite-element thermal modeling for the process. Results from modeling reveal that the thermal response is a strong function of radial location. These results also reveal that the thermal response due to interfacial heating is significantly higher under the bond pad, as compared to that around the bond pad. This is in agreement with the experimental observations. Critical points on the temperature variation curve were identified. These points can be used to correlate the sensor response to shear test data. Once the sensor response is calibrated, it can be used to monitor the bonding process. Measurements were performed at substrate temperatures of 150°C and 200°C, along with the microwelds characterization at the bonding interface. The comparison of the thermal response and the microwelds at the two substrate temperatures revealed that in order to correlate the sensor response to shear test data, the response must be obtained at the intended temperature of operation since the microwelds at two temperatures may be quite different, even though thermal responses may look similar.
  • Keywords
    Seebeck effect; integrated circuit interconnections; lead bonding; micromechanical devices; process monitoring; temperature sensors; thermopiles; ultrasonic bonding; 150 C; 200 C; Seebeck effect; ball deformation; bond pad; microelectromechanical system; microwelds characterization; thermal response; thermopile temperature sensor; transient temperature variations; ultrasonic excitation; wire bonding process monitoring; Bonding; Filtration; Finite element methods; Sensor phenomena and characterization; Signal to noise ratio; Temperature measurement; Temperature sensors; Testing; Thermal sensors; Ultrasonic variables measurement; CMOS compatible microelectromechanical system (MEMS); Seebeck effect; in situ process monitoring; thermopile temperature sensor; thermosonic ball bonding;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2005.848696
  • Filename
    1528653