Title : 
The effect of edge metal profiles on the accuracy of electrical modeling of advanced packages
         
        
            Author : 
Kaw, Ravi ; Burton, Scott ; Huang, Ching-Chao ; Luk, Clement
         
        
            Author_Institution : 
Semicond. Product Group, Agilent Technol., Santa Clara, CA, USA
         
        
        
        
        
        
        
            Abstract : 
Electronic package edge metal profiles have an effect on package characteristics on an order increasingly close to the tolerances expected for the package electrical performance. Several two-dimensional (2-D) tools are available that can be used to evaluate predesign and layout issues with nonrectangular edge profiles. However, tools that extract models from actual designs using the most up-to-date computer-aided design/computer-aided engineering (CAD/CAE) design and modeling flows do not yet take into account these real-world metal geometries. Variations in impedance and crosstalk associated with real profiles versus rectangular idealizations are identified for some typical cases and a computational procedure is discussed which may efficiently address this problem.
         
        
            Keywords : 
CAD; circuit CAD; computer aided engineering; computer aided manufacturing; electronics packaging; materials properties; CAD; CAE; advanced packages; computer-aided design; computer-aided engineering; edge metal profiles effect; electrical modeling accuracy; electronics packaging; Computer aided engineering; Crosstalk; Design automation; Impedance; Packaging; Routing; Shape; Software packages; Solid modeling; Two dimensional displays; Computer-aided engineering (CAE); cross-talk; impedance; modeling; packaging;
         
        
        
            Journal_Title : 
Advanced Packaging, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TADVP.2005.858312