• DocumentCode
    1210555
  • Title

    ATE systems¿current trends and integration into CAE environments

  • Author

    Schneider, Birger

  • Author_Institution
    ElektonikCentralen, Hÿrsholm, Denmark
  • Volume
    3
  • Issue
    4
  • fYear
    1986
  • fDate
    8/1/1986 12:00:00 AM
  • Firstpage
    148
  • Lastpage
    154
  • Abstract
    With the current industry trend towards the extensive use of LSI and VLSI integrated circuits, testing costs are changing from the traditional 5-10% to as much as 45%¿and even more in some cases. The capabilities, limitations and costs of LSI and VLSI ATE for integrated circuits are consequently having a major impact on engineers and engineering management. At the same time the market is moving towards a state where it will be dominated by semi-custom and custom circuits, thus increasing the demand to forge links between CAE and testing operations. This paper examines the current trends in the ATE industry, including the emerging array of automatic hardware and software tools that take advantage of CAE´s powerful databases and stimulus/response provisions.
  • Keywords
    CAD/CAM; VLSI; automatic test equipment; integrated circuit testing; ATE industry; ATE systems; CAE environments; LSI; VLSI integrated circuits; automatic hardware; current trends; custom circuits; databases; semi-custom; software tools;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Engineering Journal
  • Publisher
    iet
  • ISSN
    0263-9327
  • Type

    jour

  • DOI
    10.1049/cae:19860040
  • Filename
    4806979