DocumentCode
1210555
Title
ATE systems¿current trends and integration into CAE environments
Author
Schneider, Birger
Author_Institution
ElektonikCentralen, Hÿrsholm, Denmark
Volume
3
Issue
4
fYear
1986
fDate
8/1/1986 12:00:00 AM
Firstpage
148
Lastpage
154
Abstract
With the current industry trend towards the extensive use of LSI and VLSI integrated circuits, testing costs are changing from the traditional 5-10% to as much as 45%¿and even more in some cases. The capabilities, limitations and costs of LSI and VLSI ATE for integrated circuits are consequently having a major impact on engineers and engineering management. At the same time the market is moving towards a state where it will be dominated by semi-custom and custom circuits, thus increasing the demand to forge links between CAE and testing operations. This paper examines the current trends in the ATE industry, including the emerging array of automatic hardware and software tools that take advantage of CAE´s powerful databases and stimulus/response provisions.
Keywords
CAD/CAM; VLSI; automatic test equipment; integrated circuit testing; ATE industry; ATE systems; CAE environments; LSI; VLSI integrated circuits; automatic hardware; current trends; custom circuits; databases; semi-custom; software tools;
fLanguage
English
Journal_Title
Computer-Aided Engineering Journal
Publisher
iet
ISSN
0263-9327
Type
jour
DOI
10.1049/cae:19860040
Filename
4806979
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