DocumentCode :
1210634
Title :
On the verification of sequential equivalence
Author :
Jiang, Jie-Hong R. ; Brayton, Robert K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
Volume :
22
Issue :
6
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
686
Lastpage :
697
Abstract :
The state-explosion problem limits formal verification on large sequential circuits partly because the sizes of binary decision diagrams (BDDs) sizes heavily depend on the number of variables dealt with. In the worst case, a BDD size grows exponentially with the number of variables. Thus, reducing this number can possibly increase the verification capacity. In particular, this paper shows how sequential equivalence checking can be done in the sum state space. Given two finite state machines M1 and M2 with numbers of state variables m1 and m2, respectively, conventional formal methods verify equivalence by traversing the state space of the product machine with m1+m2 registers. In contrast, this paper introduces a different possibility, based on partitioning the state space defined by a multiplexed machine, which can have merely max{m1,m2}+1 registers. This substantial reduction in state variables potentially enables the verification of larger instances. Experimental results show the approach can verify benchmarks with up to 312 registers, including all of the control outputs of microprocessor 8085.
Keywords :
VLSI; binary decision diagrams; circuit CAD; equivalence classes; finite state machines; formal verification; identification; integrated circuit design; integrated logic circuits; logic CAD; sequential circuits; sequential machines; state-space methods; BDD size; FSM; binary decision diagrams; finite state machines; formal verification; large sequential circuits; multiplexed machine; sequential equivalence checking; sequential equivalence verification; sequential machines; state space. partitioning; state variables reduction; sum state space; symbolic techniques; Automata; Binary decision diagrams; Boolean functions; Data structures; Formal verification; Microprocessors; Registers; Sequential circuits; State-space methods; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2003.811446
Filename :
1201581
Link To Document :
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