DocumentCode :
1210811
Title :
Application notes - basic parameters of coplanar-strip waveguides on multilayer dielectric/semiconductor substrates, Part 1: high permittivity superstrates
Author :
Gevorgian, S. ; Berg, H. ; Jacobsson, H. ; Lewin, T.
Author_Institution :
Dept. of Microelectron., Chalmers Univ. of Technol., Gothenburg, Sweden
Volume :
4
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
60
Lastpage :
70
Abstract :
A simple method and closed-form analytic formulas for symmetric CPS based on single layer substrate (infinite and finite thickness) and multilayer lossy dielectric (semiconductor) substrate, where the permittivity of the superstrate layers decrease away from the strips, are proposed. Since the line models are given analytically, the dependencies of the line parameters may be analyzed and optimized in wide ranges of sizes, permittivities, and losses (substrate resistivity). In general, the formulas are reversible. The measured line parameters may be used to calculate the permittivity and loss tangent (resistivity) of one of the substrate layers if the parameters of the other layers and strips are known. The method may be easily extended to include larger number of substrate layers.
Keywords :
capacitance; coplanar transmission lines; coplanar waveguides; dielectric losses; permittivity; strip lines; closed-form analytic formulas; coplanar-strip waveguides; high permittivity superstrates; line models; line parameters; loss tangent; losses; multilayer dielectric/semiconductor substrates; multilayer lossy dielectric; permittivities; permittivity; single layer substrate; sizes; substrate resistivity; symmetric CPS; Conductivity; Coplanar waveguides; Dielectric losses; Dielectric substrates; Loss measurement; Nonhomogeneous media; Permittivity measurement; Semiconductor waveguides; Strips; Waveguide components;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMW.2003.1201599
Filename :
1201599
Link To Document :
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