Title :
Enhanced double-histogram test
Author :
Jalon, M.A. ; Rueda, Andrea ; Peralias, E.
Author_Institution :
Inst. de Microelectron. de Sevilla, Univ. of Seville, Seville
Abstract :
A method is introduced for reducing experimental setup complexity and time costs associated with the A/D converters linearity test using double histograms. The method is independent of the waveform of the test signal and it does not require inclusion of any time-interleaved technique to reduce time-drift effects.
Keywords :
AC-DC power convertors; circuit testing; nonlinear functions; A/D converters linearity test; enhanced double-histogram test; time-drift effects;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2009.0203
