DocumentCode :
1211110
Title :
30-GHz-band over 5-W power performance of short-channel AlGaN/GaN heterojunction FETs
Author :
Inoue, Takashi ; Ando, Yuji ; Miyamoto, Hironobu ; Nakayama, Tatsuo ; Okamoto, Yasuhiro ; Hataya, Kohji ; Kuzuhara, Masaaki
Author_Institution :
Adv. High-Frequency Device R&D Center, NEC Corp., Shiga, Japan
Volume :
53
Issue :
1
fYear :
2005
Firstpage :
74
Lastpage :
80
Abstract :
This paper describes the small-signal characterization through delay-time analysis and high-power operation of the Ka-band of AlGaN/GaN heterojunction field-effect transistors (FETs). An FET with a gatewidth of 100 μm and a gate length of 0.09 μm has exhibited a current gain cutoff frequency (fT) of 81 GHz, a maximum frequency of oscillation (fmax) of 187 GHz, and a maximum stable gain of 10.5 dB at 30 GHz (8.3 dB at 60 GHz). Delay-time analysis has demonstrated channel electron velocities of 1.50×107 to 1.75×107 cm/s in a gate-length range of 0.09-0.25 μm. State-of-the-art performance-saturated power of 5.8 W with a linear gain of 9.2 dB and a power-added efficiency of 43.2%-has been achieved at 30 GHz using a single chip having a gatewidth of 1.0 mm and a gate length of 0.25 μm.
Keywords :
III-V semiconductors; aluminium compounds; delays; gallium compounds; junction gate field effect transistors; microwave field effect transistors; power field effect transistors; silicon; silicon compounds; wide band gap semiconductors; 0.09 to 0.25 micron; 1.0 mm; 10.5 dB; 100 micron; 187 GHz; 30 GHz; 5 W; 5.8 W; 60 GHz; 8.3 dB; 81 GHz; 9.2 dB; AlGaN-GaN; Ka band heterojunction FET; Si-SiC; channel electron velocities; current gain cutoff frequency; delay time analysis; high power FET operation; oscillation frequency; short channel AlGaN-GaN heterojunction FET; small signal characterization; Aluminum gallium nitride; Cutoff frequency; Delay; Gallium nitride; Heterojunctions; Laboratories; Microwave FETs; Performance gain; Research and development; Silicon carbide;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2004.839333
Filename :
1381677
Link To Document :
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