Title :
Coupled noise predictors for lossy interconnects
Author :
Katopis, George A. ; Smith, Howard H.
Author_Institution :
Large Scale Comput. Div., IBM Corp., Poughkeepsie, NY, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
Closed form expressions for the near and far end noise of a coupled 2-line transmission structure with resistive losses have been developed for implementation in coupled noise checking software. Criteria have been defined to quantify the error of these predictors, which is shown through extensive comparisons to simulation results to be quite good over a wide range of transmission line losses. A design curve is also presented and defines the region of validity for these predictors
Keywords :
integrated circuit interconnections; integrated circuit packaging; losses; transmission line theory; closed form expressions; coupled 2-line transmission structure; coupled noise checking software; coupled noise predictors; far end noise; interconnect technology; lossy interconnects; near end noise; region of validity; resistive losses; transmission line losses; Active noise reduction; Circuit noise; Computational modeling; Coupling circuits; Integrated circuit interconnections; Noise level; Noise shaping; Phase noise; Predictive models; Propagation losses;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
