DocumentCode
1211628
Title
Special Section on the International Conference on Microelectronic Test Structures
Author
Yeric, Greg
Volume
21
Issue
2
fYear
2008
fDate
5/1/2008 12:00:00 AM
Firstpage
131
Lastpage
131
Abstract
The ten papers in this special section were selected from papers presented at the 2006 International Conference on Microelectronic Test Structures, held in Austin, TX.
Keywords
Centralized control; Circuit testing; Design for manufacture; Electronics industry; Helium; Microelectronics; Semiconductor device manufacture; Semiconductor device testing; Silicon; Special issues and sections;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2008.2000313
Filename
4512053
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