Title :
Influence of TMSO calibration standards uncertainties on VNA S-parameter measurements
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
fDate :
4/1/2003 12:00:00 AM
Abstract :
For the widespread, 12-term TMSO calibration of four-sampler vector network analyzers (VNAs), the sensitivity coefficients of the S-parameters of two ports are determined as functions of the deviations of the reflection coefficients of the one-port calibration standards and of an imperfect through connection. The expressions obtained, which have been experimentally verified, are suitable for the establishment of the uncertainty budget.
Keywords :
S-parameters; calibration; electric variables measurement; measurement errors; measurement standards; measurement uncertainty; microwave measurement; network analysers; sensitivity analysis; 12-term TMSO calibration; TMSO calibration standards; VNA S-parameter measurements; calibration uncertainty; four-sampler VNAs; one-port calibration standards; reflection coefficients; sensitivity coefficients; uncertainty budget; vector network analyzers; Attenuators; Calibration; Circuits; Crosstalk; Equations; Laboratories; Measurement standards; Metrology; Reflection; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.810041
