Determination of dielectric properties of materials using a coaxial cavity system driven by a coaxial line

Author

Li, Ching-Lieh ; Chen, Kun-Mu

Author_Institution

Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA

Volume

42

Issue

12

fYear

1994

fDate

12/1/1994 12:00:00 AM

Firstpage

2195

Lastpage

2200

Abstract

In this paper, a new scheme for characterizing dielectric materials over a wide band of frequencies is presented. The scheme utilizes a coaxial cavity partially or completely filled with material and driven by a coaxial line. This system is analyzed by the mode-matching technique. The effect of the ohmic loss of the cavity wall on the characterization of the dielectric material is addressed. The permittivity of the filling material is inversely determined from the measured reflection coefficient of the incident TEM wave to the cavity

Keywords

UHF measurement; cavity resonators; dielectric measurement; losses; measurement theory; method of moments; mode matching; permittivity measurement; cavity wall loss; coaxial cavity system; coaxial line; dielectric materials; dielectric properties; incident TEM wave; material characterization; mode-matching technique; ohmic loss; permittivity; reflection coefficient; Apertures; Coaxial components; Conducting materials; Dielectric materials; Dielectric measurements; Impedance; Integral equations; Reflection; Solids; Wideband;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.339742

Filename

339742