DocumentCode
1212345
Title
High-frequency thin-film multijunction thermal converter on a quartz crystal chip
Author
Scarioni, Luciana ; Klonz, Manfred ; Janik, Dieter ; Laiz, Héctor ; Kampik, Marian
Author_Institution
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume
52
Issue
2
fYear
2003
fDate
4/1/2003 12:00:00 AM
Firstpage
345
Lastpage
349
Abstract
The design of a new planar or thin-film multijunction thermal converter (PMJTC) on a quartz membrane and a quartz crystal chip results in a calculable standard for AC-DC voltage transfer for frequencies from 100 kHz to 100 MHz with improved uncertainties. This is due to smaller dielectric losses and higher insulation resistance in the quartz membrane and the quartz chip. The window with the membrane is anisotropically etched into the quartz crystal chip. For the first measurements, the temperature of the heater was radiometrically sensed with a thin-film infrared sensor and later with an array of 100 Cu-CuNi thermocouples. At frequencies higher than 100 kHz, the AC-DC voltage transfer differences are one order smaller than with the standard PMJTC with the Si3N4/SiO2/Si3N4 sandwich membrane on a silicon chip.
Keywords
AC-DC power convertors; etching; membranes; piezoelectric devices; quartz; spectral methods of temperature measurement; thermocouples; thermoelectric conversion; thermoelectric devices; transfer standards; voltage measurement; 100 kHz to 100 MHz; Cu-CuNi; Cu-CuNi thermocouple array; PMJTC; Si3N4-SiO2-Si3N4-Si; Si3N4/SiO2/Si3N4 sandwich membrane; SiO2; anisotropically etched membrane window; calculable AC-DC voltage transfer standard; dielectric losses; high-frequency thin-film multijunction thermal converter; insulation resistance; planar multijunction thermal converter design; quartz crystal chip; quartz membrane; radiometrically sensed heater temperature; silicon chip; thin-film infrared sensor; Analog-digital conversion; Biomembranes; Dielectric losses; Dielectric thin films; Frequency conversion; Infrared heating; Sensor arrays; Temperature measurement; Transistors; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2003.810011
Filename
1202044
Link To Document