Title :
Extension of the IEN traceability for AC voltages below 200 mV
Author :
Pogliano, Umberto ; Bosco, Gian Carlo ; D´Elia, Vincenzo
Author_Institution :
Inst. Elettrotecnico Nazionale Galileo Ferraris, Turin, Italy
fDate :
4/1/2003 12:00:00 AM
Abstract :
This paper describes the system, the standards, and the procedures developed at the Istituto Elettrotecnico Nazionale Galileo Ferraris for the extension of traceability to low voltage ranges down to 1 mV. Specific new features are the technique for the generation of low voltage, the procedures for building the traceability down to 1 mV, and the method for the evaluation of the load correction based on perturbations with known admittances.
Keywords :
calibration; electric admittance; error correction; transfer standards; voltage measurement; voltmeters; 200 to 1 mV; AC voltage; AC-DC thermal converter; IEN traceability extension; Istituto Elettroteenico Nazionale Galileo Ferraris; load admittances; load correction; low voltage generation; low voltage range extension; measurement standards; perturbations; voltmeters; Calibration; Electric variables measurement; Instruments; Low voltage; Measurement standards; Standards development; System testing; Thermal resistance; Thermal variables measurement; Voltmeters;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.810458
