DocumentCode :
1212450
Title :
Vector finite element method with mixed-interpolation-type triangular-prism element for waveguide discontinuities
Author :
Hirayama, Koichi ; Alam, Md Shah ; Hayashi, Yoshio ; Koshiba, Masanori
Author_Institution :
Dept. of Electr. &. Electron. Eng., Kitami Inst. of Technol., Japan
Volume :
42
Issue :
12
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
2311
Lastpage :
2316
Abstract :
The mixed-interpolation-type triangular-prism element is proposed and an approach based on the finite element method (FEM) with the element is formulated for the analysis of three-dimensional discontinuity problems of electromagnetic waveguides. Here, in order to treat the infinite uniform waveguide with arbitrarily shaped cross section, the eigenmodes of the uniform waveguide are computed by using the FEM with the high-order mixed-interpolation-type triangular element, and the analytical relations in the uniform waveguide are constructed numerically. A finline discontinuity, a dielectric-loaded waveguide, and a junction between a rectangular waveguide and a circular one are analyzed, and then the validity and versatility are confirmed
Keywords :
circular waveguides; dielectric-loaded waveguides; eigenvalues and eigenfunctions; finite element analysis; interpolation; rectangular waveguides; waveguide discontinuities; waveguide theory; arbitrarily shaped cross section; circular waveguide; dielectric-loaded waveguide; eigenmodes; electromagnetic waveguides; finline discontinuity; infinite uniform waveguide; mixed-interpolation-type triangular-prism element; rectangular waveguide; three-dimensional discontinuity problems; vector finite element method; waveguide discontinuities; Coplanar waveguides; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic waveguides; Finite element methods; Finline; Hollow waveguides; Rectangular waveguides; Waveguide discontinuities; Waveguide junctions;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.339757
Filename :
339757
Link To Document :
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