DocumentCode :
1212518
Title :
Analysis and design of microstrip-to-waveguide transitions
Author :
Yao, Hui-Wen ; Abdelmonem, Amr ; Liang, Ji-Fuh ; Zaki, Kawthar A.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Volume :
42
Issue :
12
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
2371
Lastpage :
2380
Abstract :
A wide band, low insertion loss transition from shielded microstrip line to rectangular waveguide is analyzed by the mode matching method and the cascading procedure using generalized scattering matrices. The transition consists of a discontinuity between a ridge waveguide and the microstrip line and a ridge waveguide impedance transformer. The microstrip eigennodes, including complex modes, are obtained by mode matching method with LSE and LSM mode expansion. The element values of the equivalent circuit for a ridge waveguide step junction is determined from its S-parameters. Computed results of a 17-22 GHz transition agree well with available experimental results. This rigorous approach provides a useful tool for the optimum design of microstrip to air filled waveguide or dielectric filled waveguide transitions
Keywords :
S-matrix theory; S-parameters; equivalent circuits; microstrip lines; mode matching; ridge waveguides; waveguide discontinuities; waveguide theory; 17 to 22 GHz; LSE mode expansion; LSM mode expansion; S-matrix; S-parameters; cascading procedure; complex modes; discontinuity; equivalent circuit; generalized scattering matrices; microstrip eigennodes; microstrip-to-waveguide transitions; mode matching method; rectangular waveguide; ridge waveguide; shielded microstrip line; step junction; waveguide impedance transformer; wideband low insertion loss transition; Insertion loss; Microstrip; Mode matching methods; Rectangular waveguides; Scattering; Transmission line matrix methods; Waveguide discontinuities; Waveguide junctions; Waveguide transitions; Wideband;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.339769
Filename :
339769
Link To Document :
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