• DocumentCode
    1212678
  • Title

    Experimental sampling distributions and confidence intervals of the Allan variance in some DC electrical measurements

  • Author

    Witt, Thomas J.

  • Author_Institution
    Bur. Int. des Poids et Mesures, Sevres, France
  • Volume
    52
  • Issue
    2
  • fYear
    2003
  • fDate
    4/1/2003 12:00:00 AM
  • Firstpage
    487
  • Lastpage
    490
  • Abstract
    The Allan variance is used to characterize stochastic serial correlations in DC electrical measurements when using instruments such as nanovoltmeters and Zener voltage standards. For such applications, it is important to be able to specify the confidence intervals for the estimated Allan variances. By repeating sets of 4096 or 8192 observations 600 times or more in succession, the experimental sampling distribution of the Allan variance is obtained and found to agree well with the chi-square distribution calculated from the number of degrees of freedom estimated from the data. An expression is obtained for approximating the number of degrees of freedom as a function of sampling time; this can then be used to estimate confidence intervals.
  • Keywords
    1/f noise; electric variables measurement; measurement theory; stochastic processes; white noise; Allan variance; DC electrical measurements; Zener voltage standards; chi-square distribution; confidence intervals; experimental sampling distributions; nanovoltmeters; noise measurement; sampling time; stochastic serial correlations; Electric variables measurement; Frequency; Instruments; Measurement standards; Noise measurement; Sampling methods; Stochastic processes; Voltage; Voltmeters; White noise;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.811653
  • Filename
    1202080