DocumentCode :
1212730
Title :
The impact of combined channel mismatch effects in time-interleaved ADCs
Author :
Vogel, Christian
Author_Institution :
Christian Doppler Lab. for Nonlinear Signal Process., Graz Univ. of Technol., Austria
Volume :
54
Issue :
1
fYear :
2005
Firstpage :
415
Lastpage :
427
Abstract :
A time-interleaved multichannel analog-to-digital converter (ADC) achieves high sampling rates with the drawback of additional distortions caused by channel mismatches. In this paper, we consider the dependency of the signal-to-noise-and-distortion ratio (SINAD) on the combination of several different channel mismatch effects. By using either explicitly given mismatch parameters or given parameter distributions, we derive closed-form equations for calculating the explicit or the expected SINAD for an arbitrary number of channels. Furthermore, we extend the explicit SINAD by the impact of timing jitter. We clarify how channel mismatches interact and perform a worst case analysis of the explicit SINAD for individual mismatch errors. We also show that equations describing the expected SINAD of individual mismatch errors are special cases of our general formulation. We indicate how to use the expected SINAD for finding efficient optimization priorities and demonstrate the importance of worst case analyses.
Keywords :
analogue-digital conversion; error analysis; signal sampling; timing jitter; analog-to-digital converter; channel mismatch effects; closed-form equations; error analysis; mismatch errors; mismatch parameters; parameter distributions; sampling rates; signal-to-noise-and-distortion ratio; time-interleaved multichannel ADC; timing jitter; Analog-digital conversion; Degradation; Equations; Error analysis; Instruments; Performance analysis; Sampling methods; Signal processing; Signal sampling; Timing jitter;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2004.834046
Filename :
1381847
Link To Document :
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