Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays

Author

Lo-Hive, Jean-Pierre ; Djordjevic, Sophie ; Cancela, Philippe ; Piquemal, François P M ; Behr, Ralf ; Burroughs, Charles J. ; Seppä, Heikki

Author_Institution

Bur. Nat. de Metrologic, Lab. Nat. d´´Essais, Fontenay Aux Roses, France

Volume

52

Issue

2

fYear

2003

fDate

4/1/2003 12:00:00 AM

Firstpage

516

Lastpage

520

Abstract

Three 1-V binary Josephson arrays developed by the NIST, the PTB, and the VTT, and using, respectively, superconductor-normal metal-superconductor (SNS), superconductor-insulator-normal metal-insulator-superconductor (SINIS), and externally shunted superconductor-insulator-superconductor (es-SIS) Josephson junctions, have been tested at BNM-LNE. The arrays have been found to work properly. Results from direct comparisons with conventional SIS arrays show a good agreement with deviations of less than 0.5 nV at any nominal voltage between 41 mV and 1.3 V.

Keywords

Josephson effect; measurement standards; superconducting arrays; superconductor-insulator-superconductor devices; superconductor-normal-superconductor devices; voltage measurement; 1 V; PTB; SINIS array; SIS array; SNS array; VTT; binary Josephson series array; electrical metrology; externally shunted SIS array; programmable voltage standard; Electric variables measurement; Josephson junctions; Measurement standards; Metal-insulator structures; NIST; Superconducting devices; Testing; Thermal force; Thermal loading; Voltage measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2003.811689

Filename

1202087