DocumentCode
1212771
Title
Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays
Author
Behr, Ralf ; Funck, Torsten ; Schumacher, Bernd ; Warnecke, Peter
Author_Institution
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume
52
Issue
2
fYear
2003
fDate
4/1/2003 12:00:00 AM
Firstpage
521
Lastpage
523
Abstract
To determine arbitrary resistance ratios with high precision, a measuring system based on a dual Josephson voltage standard has been set up. It is demonstrated that, by means of this system, 10-kΩ standard resistors can be linked to a quantized Hall resistance (i=2, 12.9 kΩ) with an expanded uncertainty (k=2) of less than 4 parts in 109.
Keywords
Josephson effect; electric resistance measurement; measurement standards; measurement uncertainty; potentiometers; quantum Hall effect; resistors; superconducting arrays; voltage measurement; 10 kohm; SINIS Josephson array; dual Josephson potentiometer; measurement uncertainty; quantized Hall resistance; resistance ratio; resistance standard; standard resistor; voltage standard; Cryogenics; Current measurement; Electrical resistance measurement; Josephson junctions; Measurement standards; Microwave antenna arrays; Potentiometers; Resistors; Switches; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2003.811569
Filename
1202088
Link To Document