DocumentCode :
1212864
Title :
Detection of parasitic potential wells or barriers in bulk-transport charge-coupled devices
Author :
Kleefstra, M. ; Heuwekemeijer, P.C.
Author_Institution :
Delft University of Technology, Electrical Engineering Department, Delft, Netherlands
Volume :
1
Issue :
2
fYear :
1977
fDate :
1/1/1977 12:00:00 AM
Firstpage :
46
Lastpage :
48
Abstract :
For bulk c.c.d.s, the depth of the potential well is obtained by measuring the differential conductance perpendicular to the c.c.d. transfer direction. A test field-effect device, the measuring method and the circuitry are presented. An example shows the ability of the method to detect parasitic potential wells in the transfer direction.
Keywords :
charge-coupled devices; bulk transport CCD; differential conductance; parasitic barriers; parasitic potential wells;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Journal on
Publisher :
iet
ISSN :
0308-6968
Type :
jour
DOI :
10.1049/ij-ssed.1977.0002
Filename :
4807513
Link To Document :
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