Title : 
Detection of parasitic potential wells or barriers in bulk-transport charge-coupled devices
         
        
            Author : 
Kleefstra, M. ; Heuwekemeijer, P.C.
         
        
            Author_Institution : 
Delft University of Technology, Electrical Engineering Department, Delft, Netherlands
         
        
        
        
        
            fDate : 
1/1/1977 12:00:00 AM
         
        
        
        
            Abstract : 
For bulk c.c.d.s, the depth of the potential well is obtained by measuring the differential conductance perpendicular to the c.c.d. transfer direction. A test field-effect device, the measuring method and the circuitry are presented. An example shows the ability of the method to detect parasitic potential wells in the transfer direction.
         
        
            Keywords : 
charge-coupled devices; bulk transport CCD; differential conductance; parasitic barriers; parasitic potential wells;
         
        
        
            Journal_Title : 
Solid-State and Electron Devices, IEE Journal on
         
        
        
        
        
            DOI : 
10.1049/ij-ssed.1977.0002