Four-port AC quantized Hall resistance measurements

Author

Ricketts, Brian W. ; Fiander, John R. ; Johnson, H. Leigh ; Small, Greig W.

Author_Institution

CSIRO Nat. Meas. Lab., Lindfield, Australia

Volume

52

Issue

2

fYear

2003

fDate

4/1/2003 12:00:00 AM

Firstpage

579

Lastpage

583

Abstract

We report four-port measurements of quantized Hall resistances (QHRs) over the frequency range of 200 Hz to 2000 kHz. The importance of capacitive current flow from the conducting layer of the QHR device is illustrated by effectively reversing the polarity of the potentials of a split guard layer in close proximity to the QHR device. The frequency dependence of the current coefficients of the quantized Hall resistances have been investigated.

Keywords

Hall effect devices; electric current; electric resistance measurement; measurement standards; quantum Hall effect; 200 Hz to 2000 kHz; QHR device conducting layer; capacitive current flow; current coefficients; four-port AC quantized Hall resistance measurements; frequency dependence; frequency range; quantized Hall resistances; split guard layer potential polarity reversal; Bridge circuits; Capacitors; Coaxial cables; Current measurement; Electrical resistance measurement; Frequency measurement; Impedance measurement; Joining processes; Probes; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2003.810016

Filename

1202101