DocumentCode :
1212919
Title :
Four-port AC quantized Hall resistance measurements
Author :
Ricketts, Brian W. ; Fiander, John R. ; Johnson, H. Leigh ; Small, Greig W.
Author_Institution :
CSIRO Nat. Meas. Lab., Lindfield, Australia
Volume :
52
Issue :
2
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
579
Lastpage :
583
Abstract :
We report four-port measurements of quantized Hall resistances (QHRs) over the frequency range of 200 Hz to 2000 kHz. The importance of capacitive current flow from the conducting layer of the QHR device is illustrated by effectively reversing the polarity of the potentials of a split guard layer in close proximity to the QHR device. The frequency dependence of the current coefficients of the quantized Hall resistances have been investigated.
Keywords :
Hall effect devices; electric current; electric resistance measurement; measurement standards; quantum Hall effect; 200 Hz to 2000 kHz; QHR device conducting layer; capacitive current flow; current coefficients; four-port AC quantized Hall resistance measurements; frequency dependence; frequency range; quantized Hall resistances; split guard layer potential polarity reversal; Bridge circuits; Capacitors; Coaxial cables; Current measurement; Electrical resistance measurement; Frequency measurement; Impedance measurement; Joining processes; Probes; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.810016
Filename :
1202101
Link To Document :
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