• DocumentCode
    1212985
  • Title

    Larger value and SI measurement of the improved cryogenic capacitor for the electron-counting capacitance standard

  • Author

    Zimmerman, Neil M. ; Sabbagh, Mahmoud A EL ; Wang, Yicheng

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    52
  • Issue
    2
  • fYear
    2003
  • fDate
    4/1/2003 12:00:00 AM
  • Firstpage
    608
  • Lastpage
    611
  • Abstract
    We report on several advances in the development of a cryogenic vacuum-gap capacitor Ccryo, for use with the electron-counting capacitance standard (ECCS). First, we have increased the value by about a factor of ten, to 10 pF; this will both make the ECCS more useful as a commercial standard and also allows a substantial reduction in the relative uncertainty of the calibration of Ccryo. Second, the capacitor´s stability is excellent, with a relative drift less than 10-9/hour. This stability is required for the third advance: we have succeeded in tuning the calculable capacitor, which allows us to make a measurement of SI units, without requiring us to fabricate the capacitor to have a precise value of Ccryo. We demonstrate such a measurement, with an uncertainty of about 4×10-8.
  • Keywords
    capacitance measurement; capacitors; cryogenic electronics; measurement standards; measurement uncertainty; 10 pF; ECCS; SI measurement; calculable capacitor tuning; capacitor stability; capacitor value; cryogenic vacuum-gap capacitor; electron-counting capacitance standard; measurement uncertainty; relative calibration uncertainty; relative drift; Bridge circuits; Calibration; Capacitance measurement; Capacitors; Cryogenics; Electrical resistance measurement; Measurement standards; NIST; Stability; Standards development;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.810026
  • Filename
    1202107