DocumentCode :
1213061
Title :
Flotation measurements to reveal the reason for the discrepancy in the molar volume of silicon
Author :
Bettin, Horst ; Toth, Hans
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume :
52
Issue :
2
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
636
Lastpage :
640
Abstract :
To reveal the reason for the discrepancy of relatively 3·10-6 in the molar volume of silicon found in crystals of different origin, the densities of crystals grown under different conditions were compared using a flotation method. The method and the apparatus used at Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, and the evaluation of data using Lagrange multipliers are described. The obtained results are reported and the contributions to the standard uncertainty of the silicon density ρsi of about 1.0·10-7ρsi are discussed.
Keywords :
density measurement; measurement uncertainty; silicon; Lagrange multiplier; Si; density; flotation measurement; measurement uncertainty; molar volume; silicon single crystal; Atomic measurements; Calibration; Crystals; Density measurement; Lagrangian functions; Silicon; Temperature; Thermal expansion; Uncertainty; Volume measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.810721
Filename :
1202113
Link To Document :
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