DocumentCode
1213219
Title
Application of Pt/a-Si:H gate GaAs FETs to wide noise margin direct-coupled FET logic
Author
Galashan, A.F. ; Bland, S.W.
Author_Institution
STC Technol. Ltd., Harlow, UK
Volume
25
Issue
20
fYear
1989
Firstpage
1344
Lastpage
1345
Abstract
The use of a Pt/a-Si:H gate on GaAs MESFET structures is shown to produce a rectifying gate with lower currents in forward bias, this being applicable to increasing noise margins in direct coupled FET logic schemes. FETs show good DC transconductance, low hysteresis in the current voltage (I/V) characteristics, and the absence of severe drift. This confirms that the approach is not hampered by slow surface states.
Keywords
III-V semiconductors; Schottky gate field effect transistors; field effect integrated circuits; gallium arsenide; hydrogen; integrated logic circuits; platinum; silicon; DC transconductance; GaAs; I-V characteristics; MESFET structures; Pt-Si:H gate; direct-coupled FET logic; forward bias; low hysteresis; rectifying gate; wide noise margin;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19890898
Filename
33985
Link To Document