• DocumentCode
    1213236
  • Title

    Dynamics of self focusing in stripe-geometry semiconductor lasers

  • Author

    Selway, P.R. ; Kirkby, P.A. ; Goodwin, A.R. ; Thompson, G.H.B.

  • Author_Institution
    Standard Telecommunication Laboratories Ltd., Harlow, UK
  • Volume
    2
  • Issue
    1
  • fYear
    1978
  • fDate
    1/1/1978 12:00:00 AM
  • Firstpage
    38
  • Lastpage
    40
  • Abstract
    The dielectric-waveguide properties of stripe-geometry semiconductor lasers can be deduced by measuring the output-beam shape in the vicinity of the laser facet. Time-resolved near-field measurements have been made on 20¿¿m wide SiO2insulated-stripe lasers and the results used to calculate the time-varying gain and refractive-index profiles during the intial part of a lasing pulse. The effects of self focusing due to the transverse distribution of injected carriers can clearly be observed.
  • Keywords
    optical waveguides; self-focusing; semiconductor junction lasers; dielectric waveguide properties; injected carriers; laser facet; self focusing; stripe geometry semiconductor lasers; time resolved near field measurements; transverse distribution;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Journal on
  • Publisher
    iet
  • ISSN
    0308-6968
  • Type

    jour

  • DOI
    10.1049/ij-ssed.1978.0005
  • Filename
    4807551
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1213236