Title :
Analytical i.g.f.e.t. model including drift and diffusion currents
Author :
Baccarani, G. ; Rudan, M. ; Spadini, G.
Author_Institution :
UniversitÃ\xa0 di Bologna, FacoltÃ\xa0 di Ingegneria, Istituto di Elettronica, Bologna, Italy
fDate :
3/1/1978 12:00:00 AM
Abstract :
An analytical i.g.f.e.t. model including drift and diffusion currents along the channel is developed. The theory, which is based on a gradual-channel approximation, is essentially equivalent to the double-integral formula by Pao and Sah, which provides correct results both in weak and in strong inversion. I.G.F.E.T. characteristics such as drain current, transconductance and output conductance are analytically expressed against the surface potential at the source and drain edges of the channel, which can be numerically evaluated in a few iterative steps. The model therefore seems suitable for c.a.d. applications.
Keywords :
insulated gate field effect transistors; semiconductor device models; CAD applications; IGFET model; diffusion currents; drain current; drift currents; output conductance; surface potential; transconductance;
Journal_Title :
Solid-State and Electron Devices, IEE Journal on
DOI :
10.1049/ij-ssed:19780011