• DocumentCode
    1213287
  • Title

    Analytical i.g.f.e.t. model including drift and diffusion currents

  • Author

    Baccarani, G. ; Rudan, M. ; Spadini, G.

  • Author_Institution
    UniversitÃ\xa0 di Bologna, FacoltÃ\xa0 di Ingegneria, Istituto di Elettronica, Bologna, Italy
  • Volume
    2
  • Issue
    2
  • fYear
    1978
  • fDate
    3/1/1978 12:00:00 AM
  • Firstpage
    62
  • Lastpage
    68
  • Abstract
    An analytical i.g.f.e.t. model including drift and diffusion currents along the channel is developed. The theory, which is based on a gradual-channel approximation, is essentially equivalent to the double-integral formula by Pao and Sah, which provides correct results both in weak and in strong inversion. I.G.F.E.T. characteristics such as drain current, transconductance and output conductance are analytically expressed against the surface potential at the source and drain edges of the channel, which can be numerically evaluated in a few iterative steps. The model therefore seems suitable for c.a.d. applications.
  • Keywords
    insulated gate field effect transistors; semiconductor device models; CAD applications; IGFET model; diffusion currents; drain current; drift currents; output conductance; surface potential; transconductance;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Journal on
  • Publisher
    iet
  • ISSN
    0308-6968
  • Type

    jour

  • DOI
    10.1049/ij-ssed:19780011
  • Filename
    4807558