• DocumentCode
    121331
  • Title

    DRC challenges and solutions for non-Manhattan layout designs

  • Author

    Cao, Ruiwu ; Ferguson, John ; Drissi, Youssef ; Gays, Fabien ; Arriordaz, Alexandre ; O´Connor, Ian

  • fYear
    2014
  • fDate
    17-21 Aug. 2014
  • Firstpage
    175
  • Lastpage
    176
  • Abstract
    As photonic circuit designs allow and require a wide variety of geometrical shapes that do not exist in traditional integrated circuit (IC) designs, established design rule checking (DRC) methods are severely inadequate and are increasingly unable to fulfill the requirements for reliable and consistent geometrical verification of such layouts. This study presents the application of equation-based DRC, an extended DRC technique that addresses the DRC challenges brought by the non-Manhattan geometries that are widely present in photonic layouts.
  • Keywords
    integrated optics; optical design techniques; silicon; DRC; design rule checking; geometrical shapes; integrated circuit; nonManhattan layout designs; photonic circuit designs; Debugging; Fabrication; Filtering; Geometry; Integrated circuits; Layout; Photonics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OMN), 2014 International Conference on
  • Conference_Location
    Glasgow
  • ISSN
    2160-5033
  • Print_ISBN
    978-0-9928-4140-9
  • Type

    conf

  • DOI
    10.1109/OMN.2014.6924580
  • Filename
    6924580