DocumentCode
121331
Title
DRC challenges and solutions for non-Manhattan layout designs
Author
Cao, Ruiwu ; Ferguson, John ; Drissi, Youssef ; Gays, Fabien ; Arriordaz, Alexandre ; O´Connor, Ian
fYear
2014
fDate
17-21 Aug. 2014
Firstpage
175
Lastpage
176
Abstract
As photonic circuit designs allow and require a wide variety of geometrical shapes that do not exist in traditional integrated circuit (IC) designs, established design rule checking (DRC) methods are severely inadequate and are increasingly unable to fulfill the requirements for reliable and consistent geometrical verification of such layouts. This study presents the application of equation-based DRC, an extended DRC technique that addresses the DRC challenges brought by the non-Manhattan geometries that are widely present in photonic layouts.
Keywords
integrated optics; optical design techniques; silicon; DRC; design rule checking; geometrical shapes; integrated circuit; nonManhattan layout designs; photonic circuit designs; Debugging; Fabrication; Filtering; Geometry; Integrated circuits; Layout; Photonics;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical MEMS and Nanophotonics (OMN), 2014 International Conference on
Conference_Location
Glasgow
ISSN
2160-5033
Print_ISBN
978-0-9928-4140-9
Type
conf
DOI
10.1109/OMN.2014.6924580
Filename
6924580
Link To Document