Title :
A curve interpretation and diagnostic technique for industrial processes
Author :
Dolins, Steven B. ; Reese, Jon D.
Author_Institution :
Dept. of Comput. Sci., Wisconsin Univ., Kenosha, WI, USA
Abstract :
Detecting manufacturing problems as soon as they occur is important for efficient manufacturing in today´s factories. Many of these problems could be minimized by installing diagnostic systems to monitor manufacturing steps. A diagnostic technique has been developed to analyze process parameters and observables that change over time. Process parameters control the operation of equipment, and observables are attributes of a partially completed product. The technique uses a specified digital signal processing algorithm known as dynamic time warping (DTW) to transform the input signal into symbolic data. Knowledge-based diagnosis is performed on the symbolic data to determine malfunctions. A detailed description of the DTW algorithm and knowledge-based analysis is presented. Two different applications-one in the glass industry and another one in the semiconductor industry-are discussed to illustrate the general use of this technique
Keywords :
computerised monitoring; computerised signal processing; glass industry; knowledge based systems; semiconductor technology; curve interpretation; diagnostic systems; digital signal processing algorithm; dynamic time warping; glass industry; knowledge-based diagnosis; manufacturing step monitoring; observables; process parameters; semiconductor industry; symbolic data; Digital signal processing; Electrical equipment industry; Glass industry; Heuristic algorithms; Manufacturing industries; Monitoring; Process control; Production facilities; Signal processing; Signal processing algorithms;
Journal_Title :
Industry Applications, IEEE Transactions on