• DocumentCode
    1213549
  • Title

    Analysis of the Frequency Response of Carbon Nanotube Transistors

  • Author

    Akinwande, Deji ; Close, Gael F. ; Wong, H. S Philip

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ.
  • Volume
    5
  • Issue
    5
  • fYear
    2006
  • Firstpage
    599
  • Lastpage
    605
  • Abstract
    The characterizations of carbon nanotube transistors at high frequencies have so far been hindered by large parasitic and extrinsic capacitances. We present a quantitative analysis of the limitations imposed by probe pad parasitics on single-wall carbon nanotube transistor characterization at gigahertz frequencies. Our analysis reveals the various kinds of frequency responses that can be expected to be measured. Furthermore, we present design guidelines and a suitable device layout to achieve gain and bandwidth at gigahertz frequencies
  • Keywords
    carbon nanotubes; field effect transistors; nanotube devices; C; bandwidth; extrinsic capacitances; frequency response; gigahertz frequencies; parasitic capacitances; probe pad parasitics; quantitative analysis; single-wall carbon nanotube transistors; Bandwidth; Capacitance measurement; Carbon nanotubes; Frequency measurement; Frequency response; Parasitic capacitance; Probes; Radio frequency; Size measurement; Transconductance; Carbon nanotube transistors; RF circuit analysis; RF transistors; frequency response;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2006.880451
  • Filename
    1695961