DocumentCode :
1213614
Title :
Wide range work function modulation of binary alloys for MOSFET application
Author :
Tsui, Bing-Yue ; Huang, Chih-Feng
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
24
Issue :
3
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
153
Lastpage :
155
Abstract :
This paper explores the characteristics of the binary alloys Ta-Pt and Ta-Ti for gate electrode application. With a proper composition of high and low work function metals, the work function of the metal alloys can be modulated from 4.16 eV to 5.05 eV continuously. The alloys show good thermal stability and inner chemical activity on both silicon dioxide and hafnium dioxide. Thermal stress generated from the alloy film increases interface state density and hence effective oxide charges. This problem can be greatly reduced with a W/Ta-Pt stack structure, where W acts as the main conducting metal and Ta-Pt acts as work function control metal. All of these properties make them suitable for use in all device applications.
Keywords :
MOSFET; interface states; metal-insulator boundaries; platinum alloys; semiconductor device metallisation; tantalum alloys; thermal stability; thermal stresses; titanium alloys; work function; 4.16 to 5.05 eV; MOSFET application; Ta-Pt work function control metal; TaTi; W main conducting metal; W-TaPt; W/Ta-Pt stack structure; alloy film; binary alloys; gate electrode application; high work function metals; inner chemical activity; interface state density; low work function metals; oxide charges; thermal stability; thermal stress; wide range work function modulation; Annealing; Capacitance; Chemicals; Electrodes; Hafnium; MOSFET circuits; Silicon alloys; Silicon compounds; Thermal stability; Thermal stresses;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2003.809528
Filename :
1202511
Link To Document :
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