• DocumentCode
    1213811
  • Title

    Infra-red microscopy direct observation of current redistribution and SPICE simulation of latch-up I/V hysteresis effects

  • Author

    Cavioni, T. ; Martino, Salvatore ; Muschitiello, Michele ; Stucchi, Michele ; Corsi, F. ; Zanoni, Enrico

  • Author_Institution
    SGS Thomson, Milan, Italy
  • Volume
    25
  • Issue
    20
  • fYear
    1989
  • Firstpage
    1371
  • Lastpage
    1372
  • Abstract
    The hysteresis cycle in the latch-up I/V characteristics of CMOS structures has been electrically observed and investigated by means of infra-red microscopy. This technique enables hysteresis effects to be correlated with current density distribution along different parasitic SCRs in a shunt connection. This correlation is confirmed by numerical simulation using SPICE.
  • Keywords
    CMOS integrated circuits; digital simulation; integrated circuit testing; optical microscopy; thyristors; CMOS structures; SPICE simulation; current density distribution; current redistribution; infra-red microscopy; latch-up I/V hysteresis effects; parasitic SCRs;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890916
  • Filename
    34003
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1213811