DocumentCode :
1213920
Title :
The change in the interface-state Fermi level of M.I.S. solar cells when going from dark to illuminated conditions
Author :
Nielsen, Otto M.
Author_Institution :
Technical University of Denmark, Laboratory for Semiconductor Technology, Lyngby, Denmark
Volume :
3
Issue :
3
fYear :
1979
fDate :
5/1/1979 12:00:00 AM
Firstpage :
57
Lastpage :
60
Abstract :
Current/voltage characteristics obtained under dark and illuminated conditions have been examined for Al-p-Si M.I.S. solar cells. The results show that the voltage drop across the oxide is changed, owing to the increased surface concentration of minority carriers when going from dark to illuminated conditions. The inverse slopes nof the linear region have been measured and the interface-state densities NSS have been calculated. From the voltage changes and interface state densities obtained, the changes in the interface-state Fermi levels have been calculated to be about 0.05¿¿0.1 eV for short-circuit currents of 25¿¿30 mA cm¿¿2
Keywords :
interface electron states; metal-insulator-semiconductor devices; solar cells; Al-p-Si; Fermi level; MIS; current voltage characteristics; interface state; minority carriers; solar cells;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Journal on
Publisher :
iet
ISSN :
0308-6968
Type :
jour
DOI :
10.1049/ij-ssed.1979.0013
Filename :
4807628
Link To Document :
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