DocumentCode :
1214045
Title :
A CMOS Integrable Oscillator-Based Front End for High-Dynamic-Range Resistive Sensors
Author :
Marcellis, Andrea De ; Depari, Alessandro ; Ferri, Giuseppe ; Flammini, Alessandra ; Marioli, Daniele ; Stornelli, Vincenzo ; Taroni, Andrea
Author_Institution :
Dept. of Electr. & Inf. Eng., Univ. of L´´Aquila, L´´Aquila
Volume :
57
Issue :
8
fYear :
2008
Firstpage :
1596
Lastpage :
1604
Abstract :
A new oscillating circuit is proposed to estimate the resistance and parallel parasitic capacitance of resistive chemical sensors. The circuit is able to reveal the resistance in a wide range (from tens of kiloohms to more than 100 GOmega) due to the adopted resistance-to-time technique. In addition, the parallel capacitance (up to 50 pF) can be estimated. The circuit, which does not need any initial calibration, is very simple and compact and is suitable to be integrated with a standard CMOS technology to obtain a low-cost and low-power device for a sensor array interface. Different kinds of post layout simulations concerning the CMOS integrated implementation have been conducted. Experimental results obtained using a discrete prototype board, both on passive components and on real sensors (metal-oxide sensors), have shown good linearity and reduced percentage error with respect to the theoretical expectations.
Keywords :
CMOS integrated circuits; gas sensors; oscillators; CMOS integrable oscillator-based front end; CMOS technology; discrete prototype board; high-dynamic-range resistive sensors; oscillating circuit; parallel parasitic capacitance; resistance-to-time technique; resistive chemical sensors; sensor array interface; Complementary metal–oxide–semiconductor (CMOS) sensor interfaces; Complementary metal??oxide??semiconductor (CMOS) sensor interfaces; gas sensors; metal–oxide (MOX) sensors; metal??oxide (MOX) sensors; resistance and capacitance estimation; wide-range sensor variation;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2008.922075
Filename :
4515887
Link To Document :
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