DocumentCode
1214233
Title
Phase-Offset Estimation in Multichannel SAR Interferometry
Author
Ferraioli, Giampaolo ; Ferraiuolo, Giancarlo ; Pascazio, Vito
Author_Institution
Dipt. per le Tecnol., Univ. di Napoli Parthenope, Napoli
Volume
5
Issue
3
fYear
2008
fDate
7/1/2008 12:00:00 AM
Firstpage
458
Lastpage
462
Abstract
Multichannel interferometric synthetic aperture radar (InSAR) systems allow the estimation of the height profile of the Earth´s surface, exploiting the availability of multiple radar acquisitions, obtained via different baselines/frequencies. Statistical approaches, in particular maximum a posteriori technique and Markov random-field image models, can be exploited for such estimation problem, which proved to be effective. However, despite the particular solution method used, the problem with multichannel interferometry is that interferograms can be affected from the presence of undetermined phase offsets, which makes it difficult to get correct height estimation in any case. In this letter, we present a procedure to estimate these phase offsets using statistical estimation; we test the procedure on both simulated and real data. For the latter, we show how an optimal estimation of the phase offsets can be used to improve the resolution of an available Shuttle Radar Topography Mission digital elevation model. The obtained results prove the effectiveness of the method and assess the overall quality of the height estimation procedure.
Keywords
Markov processes; digital elevation models; geophysical techniques; radar altimetry; radar interferometry; remote sensing by radar; synthetic aperture radar; topography (Earth); Earth surface height profile estimation; InSAR; Markov random field image models; Shuttle Radar Topography Mission; digital elevation model; interferometric synthetic aperture radar; multichannel SAR interferometry; phase-offset estimation; Digital elevation model (DEM) reconstruction; phase offsets; statistical estimation; synthetic aperture radar (SAR) interferometry;
fLanguage
English
Journal_Title
Geoscience and Remote Sensing Letters, IEEE
Publisher
ieee
ISSN
1545-598X
Type
jour
DOI
10.1109/LGRS.2008.917495
Filename
4515905
Link To Document