Title :
Current demand balancing: a technique for minimization of current surge in high performance clock-gated microprocessors
Author :
Chen, Yiran ; Roy, Kaushik ; Koh, Cheng-Kok
Author_Institution :
Electr. & Comput. Eng. Dept., Purdue Univ., West Lafayette, IN, USA
Abstract :
We propose an integrated architectural and physical planning approach to minimize the current surge in high-performance clock-gated microprocessors. In our approach, we use priority assignment optimization (PAO) and dynamic functional unit (FU) selection (DFS) to balance current demand in the floorplan. Two complementary methods-FU ordering with submodule design and issue pattern management-are also proposed to enhance the above techniques. Experimental results show that at the 0.18-/spl mu/m technology node, the PAO can reduce the peak noise by 11.75% and consequently, the decoupling capacitance (Decap) requirement by 24.22% without any degradation in instructions per cycle (IPC). Moreover, an enhanced DFS reduces the peak noise by 13.39% as well as Decap requirement by 29.58%. Experiments at the 90-nm technology node show that our methodology can further reduce the peak noise and the Decap requirement by 16.57% and 44.85% with PAO, or 18.16% and 47.58% with DFS. We also show that our approach does not increase the clock period for 0.18-/spl mu/m technology and beyond.
Keywords :
CMOS integrated circuits; circuit optimisation; current distribution; integrated circuit layout; integrated circuit noise; integrated circuit reliability; microprocessor chips; modules; 0.18 micron; 90 micron; current surge minimization; decoupling capacitance; dynamic functional unit selection; floorplan; high performance clock gated microprocessors; instructions per cycle; integrated architectural planning approach; issue pattern management; peak noise; priority assignment optimization; submodule design; Capacitance; Circuit noise; Clocks; Integrated circuit noise; Microprocessors; Minimization; Noise reduction; Power supplies; Surges; Voltage; Circuit reliability; computer architecture; integrated circuit noise; power demand;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2004.840404