Title :
Solar cells with thin Cu(In1-xGax)Se2 absorbers: Optical analysis and quantum efficiency simulations
Author :
Ibdah, Abdel-Rahman ; Aryal, Puruswottam ; Pradhan, Parth ; Rajan, Ginu ; Jian Li ; Rockett, Angus A. ; Marsillac, Sylvain ; Collins, Robert W.
Author_Institution :
Dept. Phys. & Astron., Univ. Toledo, Toledo, OH, USA
Abstract :
We present in-depth quantum efficiency analyses of of Cu(In,Ga)Se2 (CIGS) solar cells. Ex-situ spectroscopic ellipsometry (SE) analysis is applied to partially and fully completed solar cells with standard thickness and thin CIGS absorbers. Optical properties and multilayer structural data are deduced and used to predict the maximum obtainable quantum efficiency spectra and short-circuit current densities (Jsc). We validate optical model development and the resulting quantum efficiency (QE) simulations with experimental results for CIGS solar cells incorporating standard 2.2 μm thick absorbers. We find that both the bulk CIGS layer and the CdS-CIGS interface layer serve as active layer components and together contribute 100% of the photo-generated current. Thus, essentially all photo-generated carriers are collected from these layers. Solar cells with thin absorbers were also fabricated and efficiencies of 13.2% at 0.73 μm CIGS thickness, 10.1% at 0.50 μm and 8.0% at 0.36 μm were obtained. Although Jsc is expected to decrease with decreasing absorber thickness due to reduced optical collection, modeling results suggest that electronic losses are also occurring upon thinning the absorber, ranging from ~ 1.3 to 1.9 mA/cm2 for cells with CIGS thicknesses from 0.73 to 0.36 μm, respectively.
Keywords :
copper compounds; ellipsometry; gallium compounds; indium compounds; short-circuit currents; solar absorber-convertors; solar cells; ternary semiconductors; CIGS solar cells; CuIn1-xGaxSe2; SE analysis; electronic losses; multilayer structural data; optical analysis simulation; optical property; photogenerated carriers; quantum efficiency simulation; quantum efficiency spectra; short-circuit current density; size 0.73 mum to 0.36 mum; size 2 mum; spectroscopic ellipsometry; thick absorbers; thin absorbers; Loss measurement; Optical device fabrication; Optical losses; Optical variables measurement; Photovoltaic cells; Wavelength measurement; CIGS; ellipsometry; optical films; photovoltaic cells;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6924935