DocumentCode
1214349
Title
Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design
Author
Cao, Yu ; Huang, Xuejue ; Sylvester, Dennis ; King, Tsu-Jae ; Hu, Chenming
Author_Institution
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Volume
13
Issue
1
fYear
2005
Firstpage
158
Lastpage
162
Abstract
On-chip global interconnect exhibits clear frequency dependence in both resistance (R) and inductance ( L). In this paper, its impact on modern digital and radio frequency (RF) circuit design is examined. First, a physical and compact ladder circuit model is developed to capture this behavior, which only employs frequency independent R and L elements, and thus, supports transient analysis. Using this new model we demonstrate that the use of dc values for R and L is sufficient for timing analysis (i.e., 50% delay and slew rate) in digital designs. However, RL frequency dependence is critical for the analysis of signal integrity, shield line insertion, power supply stability, and RF inductor performance.
Keywords
delay circuits; digital integrated circuits; electric resistance; inductors; integrated circuit interconnections; ladder networks; power system stability; radiofrequency integrated circuits; system-on-chip; timing circuits; transient analysis; RF circuit design; RF inductor; SOC; compact ladder circuit model; delay rate; digital circuit design; digital integrated circuits; electric resistance; inductance; integrated circuit interconnections; on-chip interconnect frequency dependence; physical circuit model; power supply stability; radio frequency circuit design; radiofrequency integrated circuits; shield line insertion; signal integrity; slew rate; system-on-chip; timing analysis; transient analysis; Circuit synthesis; Delay; Frequency dependence; Inductance; Integrated circuit interconnections; Radio frequency; Radiofrequency integrated circuits; Signal analysis; Timing; Transient analysis; Delay; frequency-dependence; inductance; noise; overshoot; quality factor; resistance; slew rate;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2004.840399
Filename
1386273
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