Title :
A CMOS sensor optimized for laser spot-position detection
Author :
De Nisi, Fabrizio ; Comper, Fiorenzo ; Gonzo, Lorenzo ; Gottardi, Massimo ; Stoppa, David ; Simoni, Andrea ; Beraldin, J. Angelo
Author_Institution :
Centre for Sci. & Technol. Res. ITC-IRST, Povo Trento, Italy
Abstract :
An optical sensor architecture optimized for flying-spot, triangulation-based, three-dimensional (3-D) laser scanners will be presented. The architecture implements a spot-position detection algorithm based on a two-step procedure that allows for improved dynamic range and readout speed. The sensor, which contains two linear arrays of pixels, analog readout channels, and digital signal preprocessing circuitry, has been fabricated in 0.6-μm CMOS double-poly triple-metal technology and measures 8.17×5.67 mm2. Pixel size and shape have been selected for reducing the effect of laser speckle and for the possibility of measuring color in a multiwavelength 3-D scanner. Electrooptical test results confirm the sensor behavior as expected from simulations on a dynamic range of 80 dB and exhibits a maximum speed of 50-k voxel/s.
Keywords :
CMOS image sensors; optical scanners; optical sensors; optical variables measurement; position measurement; 0.6 micron; 3D laser scanners; 5.67 mm; 8.17 mm; CMOS sensor; digital signal preprocessing circuit; double-poly triple-metal technology; electrooptical test; flying spot; laser speckle; laser spot-position detection; multiwavelength 3D scanne; optical sensor architecture; readout channels; spot position detection algorithm; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS technology; Detection algorithms; Dynamic range; Lasers and electrooptics; Optical sensors; Sensor arrays; Shape measurement; Speckle; Three-dimensional (3-D) imaging; flying-spot active triangulation; optical sensor;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2005.859217
