• DocumentCode
    121437
  • Title

    Impact of buffer and absorber properties in the vicinity of the interface on wide-gap Cu(In,Ga)Se2 solar cell performance

  • Author

    Kanevce, Ana ; Ramanathan, Kannan ; Contreras, Miguel

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Abstract
    One of the main reasons for the Voc deficit in Cu(In,Ga)Se2 (CIGS) solar cells with a wide band gap is often attributed to interface recombination, which is a consequence of the defective heterointerface and encouraged by the non-ideal band alignment between the absorber and the CdS layer. Although a highly defective heterointerface is likely not avoidable, some properties of the buffer layer and the absorber material in the vicinity of the interface could decrease the recombination losses. Compositional variations in CIGS can result in a band gap increase at the absorber/buffer interface and type inversion in the absorber layer. Simulations predict the optimal depth of type inversion on wide band gap CIGS devices and the magnitude of device performance increase that can be expected from such structures. In addition, the benefit of the decreased thickness and increased doping of the buffer layer is calculated. The results are compared with a “standard” 1.15-eV CIGS device, where the benefits of such variations are significantly smaller.
  • Keywords
    copper compounds; indium compounds; inversion layers; solar cells; ternary semiconductors; CIGS; Cu(In-Ga)Se2; absorber material property; absorber-buffer interface; defective heterointerface; doping; electron volt energy 1.15 eV; interface recombination; nonideal band alignment; recombination loss; solar cell; Buffer layers; Charge carrier density; Doping; Performance evaluation; Photonic band gap; Photovoltaic cells; Standards; CIGS; interface recombination; numerical modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6924938
  • Filename
    6924938