DocumentCode :
1214516
Title :
Improvement of the luminous intensity of light-emitting diodes by using highly transparent Ag-indium tin oxide p-type ohmic contacts
Author :
Song, June-O ; Leem, Dong-Seok ; Kwak, Joon Seop ; Park, Y. ; Chae, S.W. ; Seong, Tae-Yeon
Author_Institution :
Dept. of Mater. Sci. & Eng., Gwangju Inst. of Sci. & Technol., South Korea
Volume :
17
Issue :
2
fYear :
2005
Firstpage :
291
Lastpage :
293
Abstract :
We have investigated Ag-indium tin oxide (ITO) scheme for obtaining high-quality p-type ohmic contacts for GaN-based light-emitting diodes (LEDs). The Ag(1 nm)-ITO(200 nm) contacts exhibit greatly improved electrical characteristics when annealed at temperatures in the range 400°C-600°C for 1 min in air, yielding specific contact resistances of ∼10-4 Ω·cm2. In addition, the contacts give transmittance of about 96% at 460 nm, which is far better than that of the conventionally used oxidized Ni-Au contacts. It is shown that the luminous intensity of blue LEDs fabricated with the Ag-ITO contacts is about three times higher than that of LEDs with oxidized Ni-Au contacts. This result strongly indicates that the Ag-ITO scheme can serve as a highly promising p-type ohmic contact for the realization of high brightness near ultraviolet LEDs.
Keywords :
III-V semiconductors; annealing; brightness; contact resistance; gallium compounds; indium compounds; light emitting diodes; ohmic contacts; optical fabrication; silver; transparency; 1 min; 1 nm; 200 nm; 400 to 600 degC; 460 nm; Ag-ITO; Ag-InSnO; Ag-indium tin oxide contacts; GaN-based light emitting diodes; annealing; blue LED; high brightness LED; highly-transparent contacts; light-emitting diodes; luminous intensity; ohmic contacts; p-type contacts; specific contact resistances; transmittance; Annealing; Brightness; Contact resistance; Electric variables; Gallium nitride; Indium tin oxide; Light emitting diodes; Materials science and technology; Ohmic contacts; Temperature measurement; Ag; GaN; indium tin oxide (ITO); light-emitting diode (LED); ohmic contact;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2004.839783
Filename :
1386292
Link To Document :
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