• DocumentCode
    1214597
  • Title

    Analysis of spread spectrum time domain reflectometry for wire fault location

  • Author

    Smith, Paul ; Furse, Cynthia ; Gunther, Jacob

  • Author_Institution
    VP Technol., LiveWire Test Labs. Inc., Salt Lake City, UT, USA
  • Volume
    5
  • Issue
    6
  • fYear
    2005
  • Firstpage
    1469
  • Lastpage
    1478
  • Abstract
    Spread spectrum time domain reflectometry (SSTDR) and sequence time domain reflectometry have been demonstrated to be effective technologies for locating intermittent faults on aircraft wires carrying typical signals in flight. This paper examines the parameters that control the accuracy, latency, and signal to noise ratio for these methods. Both test methods are shown to be effective for wires carrying ACpower signals, and SSTDR is shown to be particularly effective at testing wires carrying digital signals such as Mil-Std 1553 data. Results are demonstrated for both controlled and uncontrolled impedance cables. The low test signal levels and high noise immunity of these test methods make them well suited to test for intermittent wiring failures such as open circuits, short circuits, and arcs on cables in aircraft in flight.
  • Keywords
    aircraft power systems; arcs (electric); electric sensing devices; fault location; time-domain reflectometry; wires; AC power signal; aging wire detection; aircraft wire; arc detection; digital signal; impedance cable; intermittent wiring failure; noise immunity; open circuits; sequence time domain reflectometry; short circuits; signal to noise ratio; spread spectrum time domain reflectometry; wire fault location; Aircraft; Cables; Circuit faults; Circuit testing; Delay; Fault location; Reflectometry; Spread spectrum communication; Time domain analysis; Wire; Aging wire detection; arc detection; sequence time domain reflectometry (STDR); spread spectrum time domain reflectometry (SSTDR); time domain reflectometry (TDR); wire fault detection;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2005.858964
  • Filename
    1532290