DocumentCode :
1214670
Title :
Enhancement of Fault Injection Techniques Based on the Modification of VHDL Code
Author :
Baraza, Juan-Carlos ; Gracia, Joaquín ; Blanc, Sara ; Gil, Daniel ; Gil, Pedro-J
Author_Institution :
Grupo de Sist. Tolerantes a Fallos (GSTF) of the Dept. de Inf. de Sist. y Comput. (DISCA), Univ. Politec. de Valencia (UPV), Valencia
Volume :
16
Issue :
6
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
693
Lastpage :
706
Abstract :
Deep submicrometer devices are expected to be increasingly sensitive to physical faults. For this reason, fault-tolerance mechanisms are more and more required in VLSI circuits. So, validating their dependability is a prior concern in the design process. Fault injection techniques based on the use of hardware description languages offer important advantages with regard to other techniques. First, as this type of techniques can be applied during the design phase of the system, they permit reducing the time-to-market. Second, they present high controllability and reachability. Among the different techniques, those based on the use of saboteurs and mutants are especially attractive due to their high fault modeling capability. However, implementing automatically these techniques in a fault injection tool is difficult. Especially complex are the insertion of saboteurs and the generation of mutants. In this paper, we present new proposals to implement saboteurs and mutants for models in VHDL which are easy-to-automate, and whose philosophy can be generalized to other hardware description languages.
Keywords :
VLSI; codes; fault tolerance; hardware description languages; VHDL code; fault injection techniques; fault tolerance; mutants; saboteurs; time to market; Circuit faults; Circuit simulation; Computational modeling; Controllability; Error analysis; Fault tolerance; Gas insulated transmission lines; Hardware design languages; Time to market; Very large scale integration; Dependability validation; VHDL-based fault injection; VLSI; fault tolerance; hardware description languages (HDLs); logic design; mutants; physical faults; saboteurs;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2008.2000254
Filename :
4515957
Link To Document :
بازگشت