DocumentCode :
1214726
Title :
A 2.5 V CMOS delay-locked loop for 18 Mbit, 500 megabyte/s DRAM
Author :
Lee, Thomas H. ; Donnelly, Kevin S. ; Ho, John T C ; Zerbe, Jared ; Johnson, Mark G. ; Ishikawa, Toru
Author_Institution :
Rambus Inc., Mountain View, CA, USA
Volume :
29
Issue :
12
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
1491
Lastpage :
1496
Abstract :
This paper describes clock recovery circuits specifically designed for the hostile noise environment found aboard dynamic RAM chips. Instead of a phase-locked loop having a voltage-controlled oscillator, these circuits implement a delay-locked loop, thereby achieving low jitter and reduced sensitivity to noise on the substrate and the power supply rails. Differential signals are employed both in signal paths and in control paths, further decreasing noise sensitivity and simultaneously allowing operation from low voltage supplies. An unorthodox voltage controlled phase shifter, operating on the principle of quadrature mixing, yields a circuit with unlimited delay range (modulo 2π radians). Minor loops, enclosed within the overall loop feedback path, perform active duty cycle correction. Measured results show peak-to-peak jitter of 140 ps on the internal clock signal, and 250 ps on the external data pins, sufficiently small to allow 500 Megabyte/s transfer rates at the I/O interface
Keywords :
CMOS memory circuits; DRAM chips; circuit feedback; delay circuits; jitter; phase shifters; synchronisation; 18 Mbit; 2.5 V; 500 MByte/s; CMOS delay-locked loop; DRAM chip; active duty cycle correction; clock recovery circuits; differential signals; dynamic RAM chips; hostile noise environment; loop feedback path; low jitter operation; low voltage supplies; noise sensitivity reduction; quadrature mixing; voltage controlled phase shifter; Circuit noise; Clocks; DRAM chips; Delay; Jitter; Phase locked loops; Random access memory; Voltage control; Voltage-controlled oscillators; Working environment noise;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.340422
Filename :
340422
Link To Document :
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