Assessment of waveguide thermal response by interrogation of UV written planar gratings

Author

Sparrow, I.J.G. ; Emmerson, G.D. ; Gawith, C.B.E. ; Watts, S.P. ; Williams, R.B. ; Smith, Peter G. R.

Author_Institution

Optoelectronics Res. Centre, Univ. of Southampton, UK

Volume

17

Issue

2

fYear

2005

Firstpage

438

Lastpage

440

Abstract

The technique of direct grating writing, based on direct ultraviolet writing, is demonstrated as a tool for highly accurate measurement of waveguide and material properties. Silica-on-silicon planar samples are processed using hydrogen loading and thermal locking before Bragg channel waveguides are defined in the photosensitive core layer. The refractive index is accurately probed to compare different thermal locking procedures and characterize waveguide thermal stability.

Keywords

Bragg gratings; optical fabrication; optical planar waveguides; rapid thermal annealing; refractive index; thermal stability; thermo-optical effects; ultraviolet lithography; Bragg channel waveguides; UV written planar gratings interrogation; hydrogen loading; photosensitive core layer; refractive index; silica-on-silicon planar gratings; thermal locking; waveguide thermal stability; Bragg gratings; Etching; Optical planar waveguides; Optical waveguides; Planar waveguides; Rapid thermal processing; Refractive index; Thermal stability; Wavelength measurement; Writing; Gratings; integrated optics; photothermal effects; planar waveguides; rapid thermal processing;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2004.839457

Filename

1386341