• DocumentCode
    1215000
  • Title

    Pure magnetooptic diffraction and Kerr microscopy of periodic domain structures

  • Author

    Costa-Krämer, J.L. ; Bengoechea, A. ; Alvarez-Sánchez, R. ; Briones, F.

  • Author_Institution
    Inst. de Microelectron. de Madrid, CSIC, Madrid, Spain
  • Volume
    41
  • Issue
    11
  • fYear
    2005
  • Firstpage
    4229
  • Lastpage
    4235
  • Abstract
    The fabrication of a periodic domain structure in a ferromagnetic thin film is reported. This periodic domain structure is formed in a thin continuous magnetic film by coupling it to a periodic array of magnetic elements grown on top. When the array and the continuous film are exchange decoupled, magnetostatic interactions produce in the continuous layer a domain structure replica of the topographic pattern at selected field values. The present work reports a direct confirmation of this periodic domain structure in the flat continuous film by Kerr microscopy, which is responsible for the pure magnetooptic diffraction. The effect on the magnetization processes of oneand two-dimensional structures with different periodicities and dimensions is studied in detail and compared with micromagnetic simulations, for Co and Fe films.
  • Keywords
    Kerr magneto-optical effect; diffraction; ferromagnetic materials; magnetic domains; magnetic thin films; magnetostatics; micromagnetics; 1D structure; 2D structure; Co; Fe; Kerr microscopy; continuous magnetic film; ferromagnetic thin film; magnetic domains; magnetic element; magnetization process; magnetooptic Kerr effect; magnetooptic diffraction; magnetostatic interaction; micromagnetic simulation; periodic array; periodic domain structure; topographic pattern; Couplings; Diffraction; Fabrication; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetooptic effects; Magnetostatics; Periodic structures; Transistors; Diffraction; magnetic domains; magnetooptic Kerr effect;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.856168
  • Filename
    1532330