• DocumentCode
    121551
  • Title

    Determining the maximum open circuit voltage from absorber photoluminescence in the presence of tail states

  • Author

    Katahara, John K. ; Hillhouse, H.W.

  • Author_Institution
    Dept. of Chem. Eng., Univ. of Washington, Seattle, WA, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Abstract
    We develop a general model for sub-bandgap absorption that includes the Urbach, Franz-Keldysh, and Thomas-Fermi models as limiting forms. Combination of this absorption scheme with a generalized Kirchhoff law for spontaneous emission of photons yields a model of photoluminescence (PL) with broad applicability to many semiconductors. This model allows for full-spectrum fitting of absolute intensity PL data and outputs: (1) the functional form of sub-bandgap absorption, (2) the energy broadening term (3) the direct bandgap, (4) the local temperature, and (5) the quasi-Fermi Level Splitting (QFLS). The accuracy of the model is demonstrated by fitting the room temperature PL spectrum of GaAs. It is then applied to Cu(In,Ga)(S,Se)2 and Cu2ZnSn(S,Se)4 to reveal the nature of their tail states. The extracted QFLS is shown to accurately predict the open-circuit voltage of devices fabricated from the materials.
  • Keywords
    III-V semiconductors; Thomas-Fermi model; energy gap; gallium arsenide; photoluminescence; photons; solar absorber-convertors; solar cells; Cu(InGa)(SSe)2; Cu2ZnSn(SSe)4; Franz-Keldysh model; GaAs; Kirchhoff law; PL spectrum; QFLS; Thomas-Fermi model; Urbach model; absorber photoluminescence; energy broadening term; maximum open circuit voltage; photon emission; quasi-Fermi Level Splitting; solar cells; subbandgap absorption; tail states; Absorption; Accuracy; Fitting; Gallium arsenide; Photonic band gap; Radiative recombination; Semiconductor device modeling; Absorption; band tailing; photoluminescence; solar cells; sub-bandgap;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925052
  • Filename
    6925052