DocumentCode :
1215543
Title :
Memory performance and retention of an all-organic ferroelectric-like memory transistor
Author :
Schroeder, Raoul ; Majewski, Leszek A. ; Voigt, Monika ; Grell, Martin
Author_Institution :
Dept. of Phys. & Astron., Univ. of Sheffield, UK
Volume :
26
Issue :
2
fYear :
2005
Firstpage :
69
Lastpage :
71
Abstract :
We have built a nonvolatile memory field-effect transistor (FET)-based on organic compounds. The gate-insulating polymer features ferroelectric-like characteristics when spun from solution into an amorphous phase. Thus, the memory transistor is built using techniques developed for organic transistors without requiring high temperature annealing steps. The memory exhibits channel resistance modulations and retention times close in performance to inorganic ferroelectric FETs (FEFETs), yet at a fraction of the cost.
Keywords :
ferroelectric storage; field effect transistors; organic semiconductors; polymers; all-organic ferroelectric-like memory transistor; amorphous phase; channel resistance modulation; ferroelectric memory; gate-insulating polymer; inorganic ferroelectric FET; memory performance; memory retention; nonvolatile memory field-effect transistor; organic compound; organic transistors; Amorphous materials; Annealing; Crystallization; FETs; Ferroelectric materials; Nonvolatile memory; OFETs; Organic compounds; Plasma temperature; Polymers;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2004.841186
Filename :
1386397
Link To Document :
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